• Best papers are:

    1. Mohamed Mohie El-Din, Hassan Mostafa, Hossam Fahmy and Yehea Ismail. Leakage Power Evaluation of FinFET-Based FPGA Cluster Under Threshold Voltage Variation

    2. Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui and Koen Bertels. Non-Volatile Look-Up Table Based FPGA Implementations

    3. Hiba Abdelali, Bedira Rachida, Hichem Trabelsi and Ali Gharsallah. Enhanced Performances of Paper-based Substrate Integrated Waveguide (SIW) Antenna for Wireless Sensor Network applications

  • Keynote speakers' presentations are now available for download

  • Registration is now open

  • Notifications for regular papers

  • TN CAS contest paper submission deadline: November 25, 2016

  • A set of best papers will be considered for IEEE Design & Test

  • One proposal for Plenary Talk has been accepted

  • Two proposals for Tutorials have been accepted

  • Five proposals for Special Sessions have been accepted

  • The IDT 2016 conference will be held at the Africana ★★★★★ hotel in the city of Yasmine Hammamet


The International Design and Test Symposium is an IEEE technically co-sponsored event devoted to exploring emerging challenges and new concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability held in the Middle East and Africa (MEA) region. The Symposium is initiating in affiliation with the IEEE TTTC (Test Technology Technical Council) and the 2016 edition is organized and sponsored by CES Laboratory and the University of Sfax. It is also technically co-sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English. Topics of interest include but are not limited to:

Design Methods and Tools

Test and Reliability

  • IP and SOC Design
  • Multiprocessor/Multi-core Systems
  • Embedded Systems
  • DFX
  • Analog, Mixed Signal and RF Design
  • High Speed Circuits Design
  • Design of MEMS and MOEMS
  • Low Voltage and Low Power system
  • Innovative Technologies
  • IoT design
  • Simulation, Validation & Verification
  • System Specification and Modeling
  • Formal Methods and Verification
  • System Design/Synthesis/Optimization
  • Yield Optimization
  • IP and SOC Testing
  • Multiprocessor/Multi-Core Systems Test
  • Memory & FPGA Test & Repair
  • Automotive reliability & test
  • High Speed, Analog, Mixed Signal & RF Testing
  • MEMS/MOEMS Testing
  • Defect and Fault Modeling
  • DFT, BIST and BISR
  • On-line Testing / Fault Tolerance
  • Fault Simulation, ATPG
  • Reliability Failures/ Modeling
  • Circuit Reliability
  • Electronic System Reliability

Regular Submissions: IDT 2016 invites original, unpublished paper submissions. Paper submissions should be complete manuscripts, not exceeding six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features and describe its current status. All submissions are to be made electronically through the IDT 2016 website. Detailed instructions for submissions are to be found at the IDT 2016 website. A submission will be considered as evidence that, upon acceptance, the author(s) will prepare the final camera-ready version of the paper in time for inclusion in the proceedings, and will present the paper at the conference. All papers will be taken into consideration for the IDT 2016 Best Paper Award. In addition, a set of best papers will be considered for IEEE Design & Test.

Special Session proposals: IDT 2016 solicits Special Sessions, such as (a) Hot-Topic session addressing and discussing the challenges in topics of interest to the symposium, (b) Embedded tutorials introducing and discussing topics of interest to the attendees, (c) Panels discussing visionary and/or controversial issues. Special Session proposals consist of an extended summary (up to 1500 words) as PDF file, describing the session content and format, and must be submitted electronically through the IDT 2016 website.

Publications:  IDT 2016 will produce a Formal Proceedings of accepted papers, published under IEEEXplore. The proceedings will be available to all participants during the symposium




Regular Paper submission: November 3, 2016

Extended Special sessions and tutorials proposals: October 31, 2016
Notification of acceptance: November 22, 2016
Deadline for Paper Inclusion in Workshop Digest: December 4, 2016




Mohamed Abid: CES Laboratory, University of Sfax, Tunisia

Yervant Zorian: Synopsys (USA)





Important Dates

- November 3, 2016

  Regular Paper Submission

- November
23, 2016
 Acceptance Notification

- December
4, 2016
  Final Submission and Registration

December 18-20:
    IDT 2016

    Africana ★★★★★

    Yasmine Hammamet